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[IEEE 2013 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu (2013.4.22-2013.4.24)] 2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT) - Electromigration- and obstacle-avoiding routing tree construction

✍ Scribed by Yun-Chih Tsai, ; Tai-Hung Li, ; Tai-Chen Chen, ; Chung-Wei Yeh,

Book ID: 121691220
Publisher: IEEE
Year: 2013
Weight: 611 KB
Category: Article
ISBN: 1467344354
DOI: 10.1109/vldi-dat.2013.6533887

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