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[IEEE 2013 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu (2013.4.22-2013.4.24)] 2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT) - Automatic adaptive multi-point moment matching for descriptor system model order reduction

✍ Scribed by Wenhui Zhao, ; Pang, G. K. H.; Ngai Wong,

Book ID: 120617080
Publisher: IEEE
Year: 2013
Weight: 590 KB
Category: Article
ISBN: 1467344354
DOI: 10.1109/VLDI-DAT.2013.6533818

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