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[IEEE 2013 International Semiconductor Conference (CAS 2013) - Sinaia, Romania (2013.10.14-2013.10.16)] CAS 2013 (International Semiconductor Conference) - RF power potential of High-k metal gate 28 nm CMOS technology

โœ Scribed by Ouhachi, R.; Pottrain, A.; Ducatteau, D.; Okada, E.; Gaquiere, C.


Book ID
126791173
Publisher
IEEE
Year
2013
Weight
636 KB
Category
Article
ISBN
1467356700

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