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[IEEE 2013 International Semiconductor Conference (CAS 2013) - Sinaia, Romania (2013.10.14-2013.10.16)] CAS 2013 (International Semiconductor Conference) - Effect of uniaxial strain on the current-voltage characteristics of graphene nanoribbon field-effect transistors

✍ Scribed by Kliros, George S.

Book ID: 121828579
Publisher: IEEE
Year: 2013
Weight: 772 KB
Category: Article
ISBN: 1467356700
DOI: 10.1109/SMICND.2013.6688079

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