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[IEEE 2013 International Semiconductor Conference (CAS 2013) - Sinaia, Romania (2013.10.14-2013.10.16)] CAS 2013 (International Semiconductor Conference) - 4H-SiC Schottky contact improvement for temperature sensor applications

✍ Scribed by Draghici, F.; Badila, M.; Brezeanu, G.; Pristavu, G.; Rusu, I.; Craciunoiu, F.; Pascu, R.

Book ID: 126677668
Publisher: IEEE
Year: 2013
Weight: 948 KB
Category: Article
ISBN: 1467356700
DOI: 10.1109/SMICND.2013.6688645

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