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[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA (2013.4.14-2013.4.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - Circuit-dependent FMAX, Power and Process optimization to improve product Reliability, Availability and Serviceability

✍ Scribed by Nsame, P.; Nadkarni, R.; Klazynski, J. N.; Bickford, J.; Sumner, K.; Susso, B.; Kumar, R.; Bazan, G.; Polson, A.; Radaker, R.

Book ID: 126286411
Publisher: IEEE
Year: 2013
Weight: 909 KB
Category: Article
ISBN: 1479901113
DOI: 10.1109/IRPS.2013.6531997

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