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[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA (2013.4.14-2013.4.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - Electrical characterization of undoped diamond films for RF MEMS application

โœ Scribed by Michalas, L.; Koutsoureli, M.; Papandreou, E.; Papaioannou, G.; Saada, S.; Mer, C.; Hugon, R.; Bergonzo, P.; Leuliet, A.; Martins, P.; Bansropun, S.; Ziaei, A.


Book ID
125468618
Publisher
IEEE
Year
2013
Weight
527 KB
Category
Article
ISBN
1479901113

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