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[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA (2013.4.14-2013.4.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - Characterization of dielectric charging and reliability in capacitive RF MEMS switches

✍ Scribed by Sangchae Kim, ; Cunningham, S.; McKillop, J.; Morris, A.

Book ID: 121849987
Publisher: IEEE
Year: 2013
Weight: 559 KB
Category: Article
ISBN: 1479901113
DOI: 10.1109/IRPS.2013.6532050

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