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[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA (2013.4.14-2013.4.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - Influence of barrier design on current collapse in high voltage AlGaN/GaN HEMTs

✍ Scribed by DasGupta, S.; Biedermann, L.; Sun, M.; Kaplar, R. J.; Marinella, M. J.; Zavadil, K.; Atcitty, S.; Palacios, T.

Book ID: 121291993
Publisher: IEEE
Year: 2013
Weight: 784 KB
Category: Article
ISBN: 1479901113
DOI: 10.1109/IRPS.2013.6531986

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