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[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA (2013.4.14-2013.4.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - Influence of device self-heating on trap activation energy extraction

✍ Scribed by Soci, F.; Chini, A.; Meneghesso, G.; Meneghini, M.; Zanoni, E.

Book ID: 121181296
Publisher: IEEE
Year: 2013
Weight: 314 KB
Category: Article
ISBN: 1479901113
DOI: 10.1109/IRPS.2013.6531988

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