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[IEEE 2013 18th IEEE European Test Symposium (ETS) - Avignon, France (2013.05.27-2013.05.30)] 2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Information-theoretic syndrome and root-cause analysis for guiding board-level fault diagnosis

✍ Scribed by Ye, Fangming; Zhang, Zhaobo; Chakrabarty, Krishnendu; Gu, Xinli

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