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[IEEE 2013 18th IEEE European Test Symposium (ETS) - Avignon, France (2013.05.27-2013.05.30)] 2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - New test compression scheme based on low power BIST

✍ Scribed by Tyszer, J.; Filipek, M.; Mrugalski, G.; Mukherjee, N.; Rajski, J.

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