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[IEEE 2013 18th IEEE European Test Symposium (ETS) - Avignon, France (2013.05.27-2013.05.30)] 2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Efficient fault simulation through dynamic binary translation for dependability analysis of embedded software

✍ Scribed by Di Guglielmo, Giuseppe; Ferraretto, Davide; Fummi, Franco; Pravadelli, Graziano

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