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[IEEE 2013 17th IEEE Workshop on Signal and Power Integrity (SPI) - Paris, France (2013.05.12-2013.05.15)] 2013 17th IEEE Workshop on Signal and Power Integrity - Through silicon via admittance field solver with system level capacity: Application

✍ Scribed by Kourkoulos, Vassilis; Suaya, Roberto

Book ID: 120972919
Publisher: IEEE
Year: 2013
Weight: 702 KB
Category: Article
ISBN: 1467356778
DOI: 10.1109/SaPIW.2013.6558314

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