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[IEEE 2013 17th IEEE Workshop on Signal and Power Integrity (SPI) - Paris, France (2013.05.12-2013.05.15)] 2013 17th IEEE Workshop on Signal and Power Integrity - Using X-parameters to generate IBIS models

✍ Scribed by Comberiate, Thomas M.; Schutt-Aine, Jose E.

Book ID: 121697052
Publisher: IEEE
Year: 2013
Weight: 501 KB
Category: Article
ISBN: 1467356778
DOI: 10.1109/sapiw.2013.6558350

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