𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2013 17th IEEE Workshop on Signal and Power Integrity (SPI) - Paris, France (2013.05.12-2013.05.15)] 2013 17th IEEE Workshop on Signal and Power Integrity - Step response sensitivity of VLSI interconnects

✍ Scribed by Wardzinska, Agnieszka; Bandurski, Wojciech

Book ID: 120655385
Publisher: IEEE
Year: 2013
Weight: 704 KB
Category: Article
ISBN: 1467356778
DOI: 10.1109/SaPIW.2013.6558349

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2013 17th IEEE Workshop on Signal

[IEEE 2013 17th IEEE Workshop on Signal and Power Integrity (SPI) - Paris, France (2013.05.12-2013.05.15)] 2013 17th IEEE Workshop on Signal and Power Integrity - Fast estimation of high-speed signal integrity for coupled PCB interconnects

✍ Eudes, Thomas; Ravelo, Blaise; Lacrevaz, Thierry; Flechet, Bernard 📂 Article 📅 2013 🏛 IEEE ⚖ 209 KB

[IEEE 2013 17th IEEE Workshop on Signal

[IEEE 2013 17th IEEE Workshop on Signal and Power Integrity (SPI) - Paris, France (2013.05.12-2013.05.15)] 2013 17th IEEE Workshop on Signal and Power Integrity - An overview of modal transmission schemes

✍ Broyde, Frederic; Clavelier, Evelyne 📂 Article 📅 2013 🏛 IEEE ⚖ 683 KB

[IEEE 2013 17th IEEE Workshop on Signal

[IEEE 2013 17th IEEE Workshop on Signal and Power Integrity (SPI) - Paris, France (2013.05.12-2013.05.15)] 2013 17th IEEE Workshop on Signal and Power Integrity - Modeling and minimizing the inductance of bond wire interconnects

✍ Ndip, Ivan; Oz, Abdurrahman; Guttowski, Stephan; Reichl, Herbert; Lang, Klaus-Di 📂 Article 📅 2013 🏛 IEEE ⚖ 984 KB

[IEEE 2013 17th IEEE Workshop on Signal

[IEEE 2013 17th IEEE Workshop on Signal and Power Integrity (SPI) - Paris, France (2013.05.12-2013.05.15)] 2013 17th IEEE Workshop on Signal and Power Integrity - Effect of electrical stresses on digital integrated circuits power integrity

✍ Boyer, A.; Ben Dhia, S. 📂 Article 📅 2013 🏛 IEEE ⚖ 912 KB

[IEEE 2013 17th IEEE Workshop on Signal

[IEEE 2013 17th IEEE Workshop on Signal and Power Integrity (SPI) - Paris, France (2013.05.12-2013.05.15)] 2013 17th IEEE Workshop on Signal and Power Integrity - Using X-parameters to generate IBIS models

✍ Comberiate, Thomas M.; Schutt-Aine, Jose E. 📂 Article 📅 2013 🏛 IEEE ⚖ 501 KB

[IEEE 2013 17th IEEE Workshop on Signal

[IEEE 2013 17th IEEE Workshop on Signal and Power Integrity (SPI) - Paris, France (2013.05.12-2013.05.15)] 2013 17th IEEE Workshop on Signal and Power Integrity - Broadband rational modeling using Barycentric Vector Fitting

✍ Deschrijver, Dirk; Knockaert, Luc; Dhaene, Tom 📂 Article 📅 2013 🏛 IEEE ⚖ 911 KB