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[IEEE 2012 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Hsinchu (2012.04.23-2012.04.25)] Proceedings of Technical Program of 2012 VLSI Technology, System and Application - Comparison of differential and large-signal sensing scheme for subthreshold/superthreshold FinFET SRAM considering variability

✍ Scribed by Ming-Long Fan, ; Hu, V. P-H; Yin-Nien Chen, ; Pin Su, ; Ching-Te Chuang,

Book ID: 121183483
Publisher: IEEE
Year: 2012
Weight: 648 KB
Category: Article
ISBN: 1457720825
DOI: 10.1109/VLSI-TSA.2012.6210169

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