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[IEEE 2012 IEEE/CPMT 28th Semiconductor Thermal Measurement & Management Symposium (SEMI-THERM) - San Jose, CA, USA (2012.03.18-2012.03.22)] 2012 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - Test ASIC for investigation of thermal coupling in Many-Core Architectures

✍ Scribed by Szermer, Michal; Maj, Cezary; Pietrzak, Piotr; Janicki, Marcin; Zajac, Piotr; Napieralski, Andrzej

Book ID: 121089677
Publisher: IEEE
Year: 2012
Weight: 359 KB
Category: Article
ISBN: 146731109X
DOI: 10.1109/STHERM.2012.6188839

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