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[IEEE 2012 IEEE/CPMT 28th Semiconductor Thermal Measurement & Management Symposium (SEMI-THERM) - San Jose, CA, USA (2012.03.18-2012.03.22)] 2012 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - Cache leakage power estimation using architectural model for 32 nm and 16 nm technology nodes

✍ Scribed by Zajac, Piotr; Janicki, Marcin; Szermer, Michal; Maj, Cezary; Pietrzak, Piotr; Napieralski, Andrzej

Book ID: 120569173
Publisher: IEEE
Year: 2012
Weight: 245 KB
Category: Article
ISBN: 146731109X
DOI: 10.1109/STHERM.2012.6188865

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