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[IEEE 2012 IEEE/CPMT 28th Semiconductor Thermal Measurement & Management Symposium (SEMI-THERM) - San Jose, CA, USA (2012.03.18-2012.03.22)] 2012 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - Integration of a phase change material for junction-level cooling in GaN devices

✍ Scribed by Piedra, Daniel; Desai, Tapan G.; Bonner, Richard; Min Sun, ; Palacios, Tomas

Book ID: 121690039
Publisher: IEEE
Year: 2012
Weight: 728 KB
Category: Article
ISBN: 146731109X
DOI: 10.1109/stherm.2012.6188845

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