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[IEEE 2012 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2012.06.12-2012.06.14)] 2012 Symposium on VLSI Technology (VLSIT) - Understanding the feasibility of scaled III–V TFET for logic by bridging atomistic simulations and experimental results

✍ Scribed by Avci, Uygar E.; Hasan, Sayed; Nikonov, Dmitri E.; Rios, Rafael; Kuhn, Kelin; Young, Ian A.

No coin nor oath required. For personal study only.

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