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[IEEE 2012 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2012) - Miami, FL, USA (2012.07.16-2012.07.20)] 2012 IEEE Radiation Effects Data Workshop - Electrical Test Conditioning Influence on Total Ionizing Dose Response of SRAMs

✍ Scribed by Lawrence, Reed K.

Book ID: 120804812
Publisher: IEEE
Year: 2012
Weight: 271 KB
Category: Article
ISBN: 1467327301
DOI: 10.1109/REDW.2012.6353719

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