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[IEEE 2012 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2012) - Miami, FL, USA (2012.07.16-2012.07.20)] 2012 IEEE Radiation Effects Data Workshop - Rebound Testing of Intersil Bipolar and BiCMOS Parts

✍ Scribed by van Vonno, N. W.; Knudsen, K.; Hood, R.; Mansilla, O.; Bernard, T. M.; Chesley, P. J.

Book ID: 120804818
Publisher: IEEE
Year: 2012
Weight: 279 KB
Category: Article
ISBN: 1467327301
DOI: 10.1109/REDW.2012.6353736

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