𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2012 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2012) - Miami, FL, USA (2012.07.16-2012.07.20)] 2012 IEEE Radiation Effects Data Workshop - Recent Power MOSFET Single Event Testing Results

✍ Scribed by Scheick, Leif Z.

Book ID: 120804817
Publisher: IEEE
Year: 2012
Weight: 347 KB
Category: Article
ISBN: 1467327301
DOI: 10.1109/REDW.2012.6353735

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2012 IEEE Radiation Effects Data W

[IEEE 2012 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2012) - Miami, FL, USA (2012.07.16-2012.07.20)] 2012 IEEE Radiation Effects Data Workshop - Guide to the 2011 IEEE Radiation Effects Data Workshop Record

✍ Hiemstra, David M. 📂 Article 📅 2012 🏛 IEEE ⚖ 213 KB

[IEEE 2012 IEEE Radiation Effects Data W

[IEEE 2012 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2012) - Miami, FL, USA (2012.07.16-2012.07.20)] 2012 IEEE Radiation Effects Data Workshop - Programmatic Impact of SDRAM SEFI

✍ Guertin, Steven M.; Allen, Gregory R.; Sheldon, Douglas J. 📂 Article 📅 2012 🏛 IEEE ⚖ 453 KB

[IEEE 2012 IEEE Radiation Effects Data W

[IEEE 2012 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2012) - Miami, FL, USA (2012.07.16-2012.07.20)] 2012 IEEE Radiation Effects Data Workshop - Single Event Effects Characterization of Maxwell 7846B DAC

✍ Stone, Stephen E.; Lombardi, Robert E.; Seehra, Surinder S.; Likar, Justin J.; B 📂 Article 📅 2012 🏛 IEEE ⚖ 380 KB

[IEEE 2012 IEEE Radiation Effects Data W

[IEEE 2012 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2012) - Miami, FL, USA (2012.07.16-2012.07.20)] 2012 IEEE Radiation Effects Data Workshop - Rebound Testing of Intersil Bipolar and BiCMOS Parts

✍ van Vonno, N. W.; Knudsen, K.; Hood, R.; Mansilla, O.; Bernard, T. M.; Chesley, 📂 Article 📅 2012 🏛 IEEE ⚖ 279 KB

[IEEE 2012 IEEE Radiation Effects Data W

[IEEE 2012 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2012) - Miami, FL, USA (2012.07.16-2012.07.20)] 2012 IEEE Radiation Effects Data Workshop - Compendium of Radiation Test Results from Ball Aerospace & Technologies Corp.

✍ Scott, Katherine; Bird, John; Davies, Robert 📂 Article 📅 2012 🏛 IEEE ⚖ 425 KB

[IEEE 2012 IEEE Radiation Effects Data W

[IEEE 2012 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2012) - Miami, FL, USA (2012.07.16-2012.07.20)] 2012 IEEE Radiation Effects Data Workshop - Radiation Effect Characterization on the QorIQ P2010 Microprocessor

✍ Lambert, Damien; Vega, Xavier; Gauthier, David; Azaïs, Bruno 📂 Article 📅 2012 🏛 IEEE ⚖ 260 KB