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[IEEE 2012 IEEE International SOI Conference - Napa, CA, USA (2012.10.1-2012.10.4)] 2012 IEEE International SOI Conference (SOI) - Radiation hardness aspects of advanced FinFET and UTBOX devices

✍ Scribed by Claeys, C.; Aoulaiche, M.; Simoen, E.; Griffoni, A.; Kobayashi, D.; Mahatme, N. N.; Reed, R. A.; Schrimpf, R. D.; Agopian, P. G. D.; Martino, J. A.

Book ID: 124153183
Publisher: IEEE
Year: 2012
Weight: 973 KB
Category: Article
ISBN: 1467326895
DOI: 10.1109/SOI.2012.6404372

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