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[IEEE 2012 IEEE International SOI Conference - Napa, CA, USA (2012.10.1-2012.10.4)] 2012 IEEE International SOI Conference (SOI) - Gate length impact on UTBOX FBRAM devices

✍ Scribed by Nicoletti, T.; Santos, S. D.; Martino, J. A.; Aoulaiche, M.; Veloso, A.; Jurczak, M.; Simoen, E.; Claeys, C.

No coin nor oath required. For personal study only.

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