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[IEEE 2012 IEEE International SOI Conference - Napa, CA, USA (2012.10.1-2012.10.4)] 2012 IEEE International SOI Conference (SOI) - Improvement of high-frequency FinFET performance by fin width engineering

✍ Scribed by Makovejev, S.; Olsen, S. H.; Arshad, M. K. Md; Flandre, D.; Raskin, J.-P.; Kilchytska, V.

No coin nor oath required. For personal study only.

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