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[IEEE 2012 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2012.12.10-2012.12.13)] 2012 International Electron Devices Meeting - High density ST-MRAM technology (Invited)

✍ Scribed by Slaughter, J. M.; Rizzo, N. D.; Janesky, J.; Whig, R.; Mancoff, F. B.; Houssameddine, D.; Sun, J. J.; Aggarwal, S.; Nagel, K.; Deshpande, S.; Alam, S. M.; Andre, T.; LoPresti, P.

Book ID: 124099650
Publisher: IEEE
Year: 2012
Weight: 648 KB
Category: Article
ISBN: 1467348708
DOI: 10.1109/IEDM.2012.6479128

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