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[IEEE 2012 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2012.12.10-2012.12.13)] 2012 International Electron Devices Meeting - Uniform methodology for benchmarking beyond-CMOS logic devices

✍ Scribed by Nikonov, Dmitri E.; Young, Ian A.

No coin nor oath required. For personal study only.

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