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[IEEE 2012 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2012.12.10-2012.12.13)] 2012 International Electron Devices Meeting - Progress of STT-MRAM technology and the effect on normally-off computing systems

โœ Scribed by Yoda, H.; Fujita, S.; Shimomura, N.; Kitagawa, E.; Abe, K.; Nomura, K.; Noguchi, H.; Ito, J.


Book ID
121082611
Publisher
IEEE
Year
2012
Weight
793 KB
Category
Article
ISBN
1467348708

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