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[IEEE 2012 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2012.12.10-2012.12.13)] 2012 International Electron Devices Meeting - Modeling of hot carrier degradation using a spherical harmonics expansion of the bipolar Boltzmann transport equation

โœ Scribed by Bina, M.; Rupp, K.; Tyaginov, S.; Triebl, O.; Grasser, T.


Book ID
121381645
Publisher
IEEE
Year
2012
Weight
399 KB
Category
Article
ISBN
1467348708

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