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[IEEE 2012 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2012.12.10-2012.12.13)] 2012 International Electron Devices Meeting - MOSFET performance and scalability enhancement by insertion of oxygen layers

✍ Scribed by Xu, N.; Damrongplasit, N.; Takeuchi, H.; Stephenson, R. J.; Cody, N. W.; Yiptong, A.; Huang, X.; Hytha, M.; Mears, R. J.; Liu, Tsu-Jae King

Book ID: 121249451
Publisher: IEEE
Year: 2012
Weight: 768 KB
Category: Article
ISBN: 1467348708
DOI: 10.1109/IEDM.2012.6478990

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