𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2012 IEEE International Electron Devices Meeting (IEDM 2012) - San Francisco, CA (2012.12.10-2012.12.13)] 2012 International Electron Devices Meeting - Demonstration of scaled Ge p-channel FinFETs integrated on Si

✍ Scribed by van Dal, M. J. H.; Vellianitis, G.; Doornbos, G.; Duriez, B.; Shen, T. M.; Wu, C. C.; Oxland, R.; Bhuwalka, K.; Holland, M.; Lee, T. L.; Wann, C.; Hsieh, C. H.; Lee, B. H.; Yin, K. M.; Wu, Z. Q.; Passlack, M.; Diaz, C. H.

Book ID: 126775196
Publisher: IEEE
Year: 2012
Weight: 823 KB
Category: Article
ISBN: 1467348708
DOI: 10.1109/iedm.2012.6479089

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2012 IEEE International Electron D

[IEEE 2012 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2012.12.10-2012.12.13)] 2012 International Electron Devices Meeting - Bio-integrated electronics

✍ Rogers, J. A. 📂 Article 📅 2012 🏛 IEEE ⚖ 672 KB

[IEEE 2012 IEEE International Electron D

[IEEE 2012 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2012.12.10-2012.12.13)] 2012 International Electron Devices Meeting - Optofluidic devices and applications

✍ Psaltis, Demetri; Song, Wuzhou; Vasdekis, Andreas E. 📂 Article 📅 2012 🏛 IEEE ⚖ 761 KB

[IEEE 2012 IEEE International Electron D

[IEEE 2012 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2012.12.10-2012.12.13)] 2012 International Electron Devices Meeting - Intrinsic graphene/metal contact

✍ Nagashio, K.; Ifuku, R.; Moriyama, T.; Nishimura, T.; Toriumi, A. 📂 Article 📅 2012 🏛 IEEE ⚖ 674 KB

[IEEE 2012 IEEE International Electron D

[IEEE 2012 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2012.12.10-2012.12.13)] 2012 International Electron Devices Meeting - High density ST-MRAM technology (Invited)

✍ Slaughter, J. M.; Rizzo, N. D.; Janesky, J.; Whig, R.; Mancoff, F. B.; Houssamed 📂 Article 📅 2012 🏛 IEEE ⚖ 648 KB

[IEEE 2012 IEEE International Electron D

[IEEE 2012 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2012.12.10-2012.12.13)] 2012 International Electron Devices Meeting - Uniform methodology for benchmarking beyond-CMOS logic devices

✍ Nikonov, Dmitri E.; Young, Ian A. 📂 Article 📅 2012 🏛 IEEE ⚖ 601 KB

[IEEE 2012 IEEE International Electron D

[IEEE 2012 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2012.12.10-2012.12.13)] 2012 International Electron Devices Meeting - Analog and RF circuits design and future devices interaction

✍ Matsuzawa, Akira 📂 Article 📅 2012 🏛 IEEE ⚖ 972 KB