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[IEEE 2012 IEEE Electrical Design of Advanced Packaging and Systems Symposium (EDAPS) - Taipei, Taiwan (2012.12.9-2012.12.11)] 2012 IEEE Electrical Design of Advanced Packaging and Systems Symposium (EDAPS) - Noise coupling analysis between TSV and active circuit

✍ Scribed by Lee, Manho; Cho, Jonghyun; Kim, Joungho


Book ID
120167394
Publisher
IEEE
Year
2012
Weight
987 KB
Category
Article
ISBN
1467314455

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