[IEEE 2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Portland, OR, USA (2012.09.30-2012.10.3)] 2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) - State-of-the-art and future perspectives in calibration and de-embedding techniques for characterization of advanced SiGe HBTs featuring sub-THz fT/fMAX

[IEEE 2012 IEEE Bipolar/BiCMOS Circuits

✍ Hadi, Richard Al; Grzyb, Janusz; Heinemann, Bernd; Pfeiffer, Ullrich 📂 Article 📅 2012 🏛 IEEE ⚖ 377 KB

[IEEE 2012 IEEE Bipolar/BiCMOS Circuits

✍ Canderle, E.; Chevalier, P.; Montagne, A.; Moynet, L.; Avenier, G.; Boulenc, P.; 📂 Article 📅 2012 🏛 IEEE ⚖ 613 KB

[IEEE 2012 IEEE Bipolar/BiCMOS Circuits

✍ Avenier, G.; Chevalier, P.; Montagne, A.; Parmigiani, L.; Berthier, L.; Renault, 📂 Article 📅 2012 🏛 IEEE ⚖ 313 KB

[IEEE 2012 IEEE Bipolar/BiCMOS Circuits

✍ Cheng, Peng; Liu, Qizhi; Camillo-Castillo, Renata; Liedy, Bob; Adkisson, James; 📂 Article 📅 2012 🏛 IEEE ⚖ 675 KB

[IEEE 2012 IEEE Bipolar/BiCMOS Circuits

✍ Zampardi, P. J.; Kwok, K.; Cismaru, C.; Sun, M.; Lo, A. 📂 Article 📅 2012 🏛 IEEE ⚖ 437 KB

[IEEE 2012 IEEE Bipolar/BiCMOS Circuits

✍ Schmid, Robert L.; Coen, Christopher T.; Shankar, Subramaniam; Cressler, John D. 📂 Article 📅 2012 🏛 IEEE ⚖ 872 KB