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[IEEE 2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Portland, OR, USA (2012.09.30-2012.10.3)] 2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) - On-die self-healing of mixer image-rejection ratio for mixed-signal electronic systems

✍ Scribed by Shankar, Subramaniam; Saha, Prabir; Howard, Duane C.; Diestelhorst, Ryan; England, Troy D.; Cardoso, Adilson S.; Cressler, John D.

Book ID: 118256857
Publisher: IEEE
Year: 2012
Weight: 798 KB
Category: Article
ISBN: 1467330191
DOI: 10.1109/bctm.2012.6352658

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