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[IEEE 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012) - Dresden (2012.03.12-2012.03.16)] 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) - A block-level flash memory management scheme for reducing write activities in PCM-based embedded systems

✍ Scribed by Duo Liu, ; Tianzheng Wang, ; Yi Wang, ; Zhiwei Qin, ; Zili Shao,

Book ID: 120623082
Publisher: IEEE
Year: 2012
Weight: 255 KB
Category: Article
ISBN: 3981080181
DOI: 10.1109/DATE.2012.6176593

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