[IEEE 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012) - Dresden (2012.03.12-2012.03.16)] 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Design for test and reliability in ultimate CMOS

✍ Scribed by Nicolaidis, M.; Anghel, L.; Zergainoh, N-E; Zorian, Y.; Karnik, T.; Bowman, K.; Tschanz, J.; Shih-Lien Lu, ; Tokunaga, C.; Raychowdhury, A.; Khellah, M.; Kulkarni, J.; De, V.; Avresky, D.

• Book ID: 125519363
• Publisher: IEEE
• Year: 2012
• Weight: 202 KB
• Category: Article
• ISBN: 3981080181
• DOI: 10.1109/DATE.2012.6176556