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[IEEE 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012) - Dresden (2012.03.12-2012.03.16)] 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Model driven resource usage simulation for critical embedded systems

✍ Scribed by Lafaye, M.; Pautet, L.; Borde, E.; Gatti, M.; Faura, D.

Book ID: 121410893
Publisher: IEEE
Year: 2012
Weight: 385 KB
Category: Article
ISBN: 3981080181
DOI: 10.1109/DATE.2012.6176486

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