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[IEEE 2012 79th ARFTG Microwave Measurement Conference (ARFTG) - Montreal, QC, Canada (2012.06.22-2012.06.22)] 79th ARFTG Microwave Measurement Conference - VNA Tools II: S-parameter uncertainty calculation

✍ Scribed by Wollensack, Michael; Hoffmann, Johannes; Ruefenacht, Juerg; Zeier, Markus

No coin nor oath required. For personal study only.

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