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[IEEE 2012 79th ARFTG Microwave Measurement Conference (ARFTG) - Montreal, QC, Canada (2012.06.22-2012.06.22)] 79th ARFTG Microwave Measurement Conference - Time domain large signal characterization of self-biasing phenomena in switch-mode AlGaN/GaN HEMTs

✍ Scribed by Faraj, J.; Callet, G.; Jardel, O.; El-Rafei, A.; De Groote, F.; Quere, R.; Teyssier, J-P.

No coin nor oath required. For personal study only.

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