[IEEE 2012 24th International Symposium on Power Semiconductor Devices & IC's (ISPSD) - Bruges, Belgium (2012.06.3-2012.06.7)] 2012 24th International Symposium on Power Semiconductor Devices and ICs - Investigation of voltage-dependent thermal property in high-voltage drain-extended MOSFETs

✍ Scribed by Chu, Chen-Liang; Hu, C.M.; Huang, C.F.; Chen, Y.S.; Chen, F.Y.; Thei, K.B.; Hsu, C.C.; Yao, C.W.; Liou, R.S.; Tuan, H.C.

• Book ID: 115538801
• Publisher: IEEE
• Year: 2012
• Weight: 893 KB
• Category: Article
• ISBN: 1457715961
• DOI: 10.1109/ispsd.2012.6229037