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[IEEE 2012 24th International Symposium on Power Semiconductor Devices & IC's (ISPSD) - Bruges, Belgium (2012.06.3-2012.06.7)] 2012 24th International Symposium on Power Semiconductor Devices and ICs - Analysis for rapid tail current decay in IGBTs with low dose p-emitter

✍ Scribed by Kobayashi, Yusuke; Nakagawa, Akio; Takei, Manabu; Onishi, Yasuhiko; Fujishima, Naoto

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