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[IEEE 2012 21st Asian Test Symposium (ATS) - Niigata, Japan (2012.11.19-2012.11.22)] 2012 IEEE 21st Asian Test Symposium - A Test Screening Method for 28 nm HK/MG Single-Port and Dual-Port SRAMs Considering with Dynamic Stability and Read/Write Disturb Issues

✍ Scribed by Nii, Koji; Tsukamoto, Yasumasa; Ishii, Yuichiro; Yabuuchi, Makoto; Fujiwara, Hidehiro; Okamoto, Kazuyoshi

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