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[IEEE 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012) - Singapore, Singapore (2012.07.2-2012.07.6)] 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Thermal analysis of AlGaN/GaN High-Electron-Mobility Transistors by Infrared Microscopy

✍ Scribed by Zhao, Miao; Liu, Xinyu; Yingkui, Zheng; Wei, Ke; Mingzeng, Peng; Yankui, Li; Guoguo, Liu

Book ID: 126616016
Publisher: IEEE
Year: 2012
Weight: 538 KB
Category: Article
ISBN: 1467309826
DOI: 10.1109/IPFA.2012.6306275

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