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[IEEE 2012 10th IEEE International Conference on Semiconductor Electronics (ICSE) - Kuala Lumpur, Malaysia (2012.09.19-2012.09.21)] 2012 10th IEEE International Conference on Semiconductor Electronics (ICSE) - Very high speed and low voltage open-loop dual edge triggered sample and hold circuit in 0.18μm CMOS technology

✍ Scribed by Hasan-Sagha, Mohamad; Jalali, Mohsen

Book ID: 121084177
Publisher: IEEE
Year: 2012
Weight: 401 KB
Category: Article
ISBN: 1467323942
DOI: 10.1109/SMElec.2012.6417227

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