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[IEEE 2011 International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Suita, Osaka, Japan (2011.05.19-2011.05.20)] 2011 International Meeting for Future of Electron Devices - Reconsideration of minority carrier diffusion in nanoscale wire Si pn junction

✍ Scribed by Fujita, Shinji; Kotoug, Toshiya; Omura, Yasuhisa

Book ID: 115450881
Publisher: IEEE
Year: 2011
Weight: 246 KB
Volume: 0
Category: Article
ISBN: 1612841457
DOI: 10.1109/imfedk.2011.5944845

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