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[IEEE 2011 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2011) - Las Vegas, NV, USA (2011.07.25-2011.07.29)] 2011 IEEE Radiation Effects Data Workshop - SEU and MBU Angular Dependence of Samsung and Micron 8-Gbit SLC NAND-Flash Memories under Heavy-Ion Irradiation

✍ Scribed by Grurmann, Kai; Walter, Dietmar; Herrmann, Martin; Gliem, Fritz; Kettunen, Heikki; Ferlet-Cavrois, Veronique

Book ID: 120820626
Publisher: IEEE
Year: 2011
Weight: 335 KB
Category: Article
ISBN: 1457712814
DOI: 10.1109/REDW.2010.6062521

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