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[IEEE 2011 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2011) - Las Vegas, NV, USA (2011.07.25-2011.07.29)] 2011 IEEE Radiation Effects Data Workshop - Wafer by Wafer Low Dose Rate Qualification in a Production Environment

✍ Scribed by van Vonno, N. W.; Pearce, L. G.; Northen, A. L.; Touvell, J. R.; Brewster, J. C.; Gill, J. S.; Thomson, E. T.; Chesley, P. J.; Schettler, D.

Book ID: 120820622
Publisher: IEEE
Year: 2011
Weight: 669 KB
Category: Article
ISBN: 1457712814
DOI: 10.1109/REDW.2010.6062512

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