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[IEEE 2011 IEEE International Symposium on Electromagnetic Compatibility - EMC 2011 - Long Beach, CA, USA (2011.08.14-2011.08.19)] 2011 IEEE International Symposium on Electromagnetic Compatibility - Modeling from local to subsystem level effects in analog and digital circuits due space induced Single Event Transients

✍ Scribed by Perez, Reinaldo J

Book ID: 121475437
Publisher: IEEE
Year: 2011
Weight: 892 KB
Category: Article
ISBN: 1457708124
DOI: 10.1109/ISEMC.2011.6038328

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